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Figure 4
Integrated Laue diffraction pattern of copper sulfate pentahydrate recorded at 0.71 GPa, φ = −30°, using the mini-DAC. The blue pattern shows the sample ellipses, the darker ones being the model peaks (inset A). Inset B shows rejected sample Laue spots (red) that are very close to or overlapping the diamond reflections. The same colour code and contrast adjustment as those of Fig. 3 were applied. |
IUCrJ
ISSN: 2052-2525
NEUTRON | SYNCHROTRON
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