An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. Corrigendum

Assalauova, D.; Kim, Y.Y.; Bobkov, S.; Khubbutdinov, R.; Rose, M.; Alvarez, R.; Andreasson, J.; Balaur, E.; Contreras, A.; DeMirci, H.; Gelisio, L.; Hajdu, J.; Hunter, M.S.; Kurta, R.P.; Li, H.; McFadden, M.; Nazari, R.; Schwander, P.; Teslyuk, A.; Walter, P.; Xavier, P.L.; Yoon, C.H.; Zaare, S.; Ilyin, V.A.; Kirian, R.A.; Hogue, B.G.; Aquila, A.; Vartanyants, I.A.

doi:10.1107/S2052252522000501

Figure 3
Classification of diffraction patterns by EM clustering. (c) Averaged PSD functions for EM-based single-hit selection containing 1085 patterns (blue line) and for manual selection containing 1393 patterns (orange line).

IUCrJ

Volume 9| Part 2| March 2022| Pages 328

ISSN: 2052-2525

https://doi.org/10.1107/S2052252522000501

PHYSICS | FELS

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