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Figure 2
Representative Rietveld refined diffraction patterns and fitting results of (a) Se-V at 94 GPa, with a = 3.8687 (6) Å and c = 2.9086 (2) Å (WR = 1.17%, χ2 = 25.6564, GOF = 0.23); (b) Se-V′ at 125 GPa with a = 3.8205 (18) Å and c = 2.7760 (3) Å (WR = 0.94%, χ2 = 17.3023, GOF = 0.18); (c) Se-V′ with a = 3.8450 (30) Å and c = 2.6371 (6) Å, Se-VI with a = 2.8191 (6) Å at 148 GPa (WR = 1.06%, χ2 = 20.719, GOF = 0.21); and (d) Se-VI at 185 GPa, with a = 2.7755 (5) Å (WR = 2.12%, χ2 = 87, GOF = 0.42).

IUCrJ
Volume 9| Part 2| March 2022| Pages 253-260
ISSN: 2052-2525
https://doi.org/10.1107/S2052252522000252