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Figure 1
Increase in number of (a) unique and (b) total data with increasing resolution and (c) distribution of reflections versus intensity of measurements 1a and 1b. Respective plots for all measurements can be found in the supporting information. (d) Side profile of an arbitrarily chosen reflection (14 14 17) from experiment 1 on the detector at a resolution of 0.81 Å for Cu Kα and Cu Kβ radiation in line representation.

Volume 9| Part 3| May 2022| Pages 349-354
ISSN: 2052-2525