Modelling fine-sliced three dimensional electron diffraction data with dynamical Bloch-wave simulations

Cleverley, A.; Beanland, R.

doi:10.1107/S2052252522011290

Figure 1
An illustration of the range of intensities that are obtained for the kinematically forbidden $[{\overline{14}}\ {\overline 2}\ {\overline 2}]$ reflection in silicon with a thickness of 180 nm in a dynamical simulation. The image underneath shows the corresponding LACBED pattern (see section 3

)