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Figure 10
(a) The direct beam profile, obtained by averaging all frames in the Si cRED data and a Lorentzian fit. (b) R1 calculation after optimizing the geometry and correcting for the slew rate and beam profile (specimen thickness 185 nm). R1 = 8.9%. (c) R1 for the kinematic model K and initial dynamical model D, with geometry optimization G, corrections for slew rate S and beam profile P, and refinement of Debye–Waller factor DWF. |
IUCrJ
ISSN: 2052-2525
ELECTRON CRYSTALLOGRAPHY
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