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Figure 3
The blue line shows the total intensity in the Si cRED ED pattern as a function of goniometer angle α, normalized to an average of unity and offset by 0.4. The black line shows the relative direct beam intensity for the data, normalized to an average of unity (red line). See also Fig. S2.

IUCrJ
Volume 10| Part 1| January 2023| Pages 118-130
ISSN: 2052-2525
https://doi.org/10.1107/S2052252522011290