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Figure 5
(a) SEM micrographs of an (110)/(110) ISSA seeded sample from the middle to the edge. (b) Local SEM image at a higher magnification showing the details of the (110)/(110) grain boundary. (c) and (d) Trapped field profiles (3D maps) measured at top surfaces of samples in Fig. 4[link](a) and 4[link](c).

Volume 10| Part 2| March 2023| Pages 177-188
ISSN: 2052-2525