Investigation of the milling characteristics of different focused-ion-beam sources assessed by three-dimensional electron diffraction from crystal lamellae

Parkhurst, J.M.; Crawshaw, A.D.; Siebert, C.A.; Dumoux, M.; Owen, C.D.; Nunes, P.; Waterman, D.; Glen, T.; Stuart, D.I.; Naismith, J.H.; Evans, G.

doi:10.1107/S2052252523001902

Figure 10
Atomic potential for a tryptophan with a contour level of 1.8σ for merged data from each milling source. Data were refined to the highest resolution achieved for each combined dataset, which was 1.75 Å for argon, 1.74 Å for xenon and 1.84 Å for gallium, respectively.

IUCrJ

Volume 10| Part 3| May 2023| Pages 270-287

ISSN: 2052-2525

https://doi.org/10.1107/S2052252523001902

ELECTRON CRYSTALLOGRAPHY

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