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Figure 5
Thickness estimate obtained from tomography versus the thickness estimate obtained from the log-ratio method. The points represent multiple measurements from each lamella. The error bars indicate the standard error of the thicknesses recorded by the log-ratio and tomography methods, respectively. The black line indicates the fit to the data points with the slope giving an estimate of the constant scale factor to calibrate the log-ratio thickness measurements. |
ISSN: 2052-2525
ELECTRON CRYSTALLOGRAPHY
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