Investigation of the milling characteristics of different focused-ion-beam sources assessed by three-dimensional electron diffraction from crystal lamellae

Parkhurst, J.M.; Crawshaw, A.D.; Siebert, C.A.; Dumoux, M.; Owen, C.D.; Nunes, P.; Waterman, D.; Glen, T.; Stuart, D.I.; Naismith, J.H.; Evans, G.

doi:10.1107/S2052252523001902

Figure 8
Data-processing statistics as a function of milling source: (a) CC_1/2 overall to 2 Å; (b) resolution estimate based on CC_1/2; (c) I/σ(I) overall to 2 Å; (d) I mean to 2 Å; (e) R_free to 2 Å; (f) FSC_average to 2 Å.

IUCrJ

Volume 10| Part 3| May 2023| Pages 270-287

ISSN: 2052-2525

https://doi.org/10.1107/S2052252523001902

ELECTRON CRYSTALLOGRAPHY

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