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Figure 1
(a) An XFEL X-ray pulse is used to collect a diffraction pattern from a gold thin film after it has been pumped by an optical laser pulse. This pattern is collected in one shot on a Rayonix optically coupled charge-coupled device (CCD) 50 mm behind the sample. As the laser destroys the sample, each shot is taken using a unique sample window from a 2D array. (b) Diffraction intensity (log scale) from single pump–probe shots of monochromatic X-rays from PAL-XFEL with varying pump–probe delay times. The background has been measured and subtracted. Dashed lines indicate split Bragg peak positions after pumping. (c) Schematic of melting around grain boundary locations in a polycrystalline metal thin film, indicating the propagation of the laser-excited melt front as described by Assefa et al. (2020 ![]() ![]() |
IUCrJ
ISSN: 2052-2525
NEUTRON | SYNCHROTRON
Open
access
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