Kilohertz serial crystallography with the JUNGFRAU detector at a fourth-generation synchrotron source

Leonarski, F.; Nan, J.; Matej, Z.; Bertrand, Q.; Furrer, A.; Gorgisyan, I.; Bjelčić, M.; Kepa, M.; Glover, H.; Hinger, V.; Eriksson, T.; Cehovin, A.; Eguiraun, M.; Gasparotto, P.; Mozzanica, A.; Weinert, T.; Gonzalez, A.; Standfuss, J.; Wang, M.; Ursby, T.; Dworkowski, F.

doi:10.1107/S2052252523008618

Figure 3
(a) A schematic explanation of the data-collection pattern used to record the millisecond datasets. (b) A difference map of F_o from bin #21 (probe, 1 ms after illumination) minus F_o of bin #8 (dark). (c) A difference map of 1 ms F_o (PDB ID 6tk2) minus dark F_o (PDB ID 6tk6) recorded at SwissFEL [data from Skopintsev et al. (2020