Figure 4
A comparison of different loading methods. (a) and (b) Schemes showing the practical difference between the loading methods. (a) In high-conc/low-vol experiments, low volumes of highly concentrated slurries were tested. (b) In low-conc/high-vol experiments, the reverse was true; higher volumes of less concentrated slurries were used. (c) and (d) Graphs plotting aperture hit rates as a function of crystal concentration for 25 µm HEWL crystals for the high-conc and low-conc methods, respectively. The aperture hits have been divided into single- and multi-hits to indicate whether one or more than one crystal was found in the well. Data obtained from 25 µm insulin crystals deposited on silicon chips at a synchrotron (Davy et al., 2019) have also been plotted for comparison. (e) An assessment of the loading efficiency given as a percentage of the absolute number of crystals used versus exposed. The single-hit data from silicon chips (Davy et al., 2019) have also been plotted, and an estimate of the efficiency of a viscous extruder, with comparably sized crystals, from a beam time at the SwissFEL Alvra endstation. |