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Figure 7
Data-quality indicators from chip data collections. (a) A comparison of the total background observed between the MISP chips collected at Cristallina and the viscous extruder collected in the Alvra gas chamber with 200 mbar He. The background is shown as a radial integral given in mean photon counts. The solid angle shown has been limited to the effective size of a 4 Mpixel detector. The total background from the MISP chip will also include contributions from the air, sealing films and sample. (b) CC1/2 plots for the 25, 10 and 5 µm HEWL crystals. Each is based on ∼30 000 integrated and merged images. The 0.3 criterion line has been shown. (c) The unit-cell volume plotted as a function of aperture number for representative chips loaded with 25, 10 and 5 µm HEWL crystals.

IUCrJ
Volume 10| Part 6| November 2023| Pages 678-693
ISSN: 2052-2525
https://doi.org/10.1107/S2052252523007595