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Figure 2
Left: the average positions of Sb (orange) and Nb (green) atoms in the x0.5z plane. Right: difference Fourier maps in the x0.5z plane after refinement of the average structure of the thermally quenched sample (Q-0.84 #2) with the centre model, for both single-crystal X-ray diffraction data and 3DED data acquired on three different crystals. The difference Fourier map of the X-ray diffraction data shows differences in the electron density, whereas the difference Fourier maps of the electron diffraction data show differences in the electrostatic potential.

IUCrJ
Volume 11| Part 1| January 2024| Pages 82-91
ISSN: 2052-2525
https://doi.org/10.1107/S2052252523010254