Structure determination using high-order spatial correlations in single-particle X-ray scattering

Zhao, W.; Miyashita, O.; Nakano, M.; Tama, F.

doi:10.1107/S2052252523009831

Figure 7
(a) A simulated diffraction pattern with two large corners in the second and fourth quadrants removed. (b) Double correlations at (k₁, k₂) = (0.15 nm⁻¹, 0.25 nm⁻¹) computed from 10 000 full diffraction patterns and 10 000 partial diffraction patterns. (c) The model reconstructed from partial patterns. The isosurface is plotted at 10% of the maximum density. (d) FSCs of the model in (c), reconstructed from partial patterns, and the model in Fig. 3