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Figure 1
Typical length scales in the materials science of hard materials. The structures above the length scale arrow (from left to right) are the crystal structure, precipitates, grain structure and meso-structure. The analytical techniques for structural measurements shown below the arrow are color-coded for surface and bulk methods. From top to bottom, they are X-ray diffraction and neutron diffraction (XRD/ND), transmission electron microscopy (TEM), atomic force microscopy (AFM), small-angle X-ray scattering and ultra-small-angle X-ray scattering (SAXS/USAXS), scanning electron microscopy (SEM), optical microscopy, and X-ray computed tomography (X-ray CT).

IUCrJ
Volume 11| Part 5| September 2024| Pages 675-694
ISSN: 2052-2525
https://doi.org/10.1107/S2052252524006298