Figure 2
Schematics of two primary types of USAXS Instruments. (a) Pinhole configuration: in this setup, the scattering pattern is typically recorded on a 2D area detector. USAXS data are generally collected using the maximum feasible sample-to-detector distance, contingent on the specific sample-to-detector distance and the X-ray wavelength. (b) Bonse–Hart Type USAXS instrument: the q resolution depends on the crystal optics, the order of reflection and the X-ray wavelength. |