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Figure 1
Schematics of acquiring experimental and simulated diffraction patterns. (a) The sample is raster-scanned using a focused X-ray beam in the y′/z′ direction for various rotation (ϕ) and tilt ([\kappa]) angles. At each point, a full diffraction pattern is collected, parametrized by the momentum transfer q and the azimuthal component χ of diffraction. (b) A simulated diffraction pattern originates from an ODF and a crystal structure. The ODF is parametrized by orientations of the three angles ([\omega,\vartheta,\varphi]) which describe axis–angle rotations in the sample CS (x, y, z). The ODF shown is color-coded so that brighter colors mean higher probability of the respective orientation. Each crystal orientation yields a different single-crystal diffraction pattern and the resulting image is the sum over all of them weighted by the ODF.

IUCrJ
Volume 11| Part 5| September 2024| Pages 809-820
ISSN: 2052-2525
https://doi.org/10.1107/S2052252524006547