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Figure 5
Possible explanations for the light contamination being observed in the open orientation but not in the flat orientation. (a) A schematic drawing of the X-ray/pump-laser view of the chip in the open and flat orientations. In the open view, the entire crystal is visible, enabling contamination via a large laser profile. The same large laser profile in the flat orientation does not give rise to contamination due to the restricted view of the crystals. (b) Schematic drawings showing how potential scattered pump laser from the pre-sample scatter guard could give rise to light contamination. Again, the restricted view of the crystals in the flat orientation prevents contamination of crystals in adjacent wells. (c) An image collected with the help of the Max Planck Institute, Heidelberg using an SOS chip (Doak et al., 2018BB11) containing 1 M cadmium chloride and a schematic drawing of its implications for the MISP chip. The image was collected using the OAV camera of SwissMX. The yellow grid shows the intended shot locations. The red arrow shows the direction of travel of the stages. Due to the 1 ms offset of the stage motion and XFEL, the XFEL shot is 12 µm off the aperture centre.

IUCrJ
Volume 11| Part 5| September 2024| Pages 749-761
ISSN: 2052-2525
https://doi.org/10.1107/S2052252524005591