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Figure 17
Labeling 60S targets in yeast lamella. (a) Image 151_Mar12_12.31.16_167_0.mrc from previous work (the thickness was estimated to be 114 nm; Lucas et al., 2022BB31). Control peaks are selected based on the threshold determined in (b). Particles are plotted with their 2DTM-derived alignment parameters. (b) Distribution of z-scores across all locations in the image using mature 60S as the template. The dashed blue curve represents the fitted GEV distribution. The threshold that best separates false matches (bulk) from true matches (tail) is labeled.

IUCrJ
Volume 12| Part 2| March 2025| Pages 155-176
ISSN: 2052-2525
https://doi.org/10.1107/S2052252524011771