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Figure 1
Overview of the experimental setup employed at SwissFEL during the experiment and measurements of the pulse durations used. (a) An overview of the optics and devices in the Cristallina beamline path with approximate distances from the end of the undulator line. The acronyms used are as follows: PSSS, photon single-shot spectrometer; HOM, horizontal offset mirror; VOM, vertical offset mirror; HKB/VKB, horizontal and vertical focusing mirrors; JF, Jungfrau. (b) Experimental setup used, highlighting the X-ray beam path, polymer fixed target (yellow) and chip motion. (c) Temporal profiles of XFEL pulses, centred on t = 0, at different machine configurations A–D, measured with the diagnostic wakefield structure averaged from 20 single-shot measurements.

IUCrJ
Volume 12| Part 3| May 2025|
ISSN: 2052-2525
https://doi.org/10.1107/S2052252525002660