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Figure 12
(a) Wilson plots of serial diffraction data from DtpAa microcrystals collected at SACLA by Ebrahim et al. (2019View full citation) using a patterned silicon chip as deposited (PDB entry 6i34, red line) and reprocessed by us (green line) and at SwissFEL (orange line) and ID29 (blue line) using an SOS chip and 100 × 100 µm (Δx, Δy) spacing between X-ray exposures. For comparison, the lowest dose SSX data published by Ebrahim et al. (2019View full citation) are shown in purple. They closely follow the Cristallina-MX data. By contrast, the high-resolution part of the 100 × 100 µm ID29 data falls off much more steeply, indicating differing diffraction properties. The underlying reason is not saturation of detector pixels (see Supplementary Fig. S6), but is most likely a radiation-damage process akin to Bragg termination. The slopes of the high-resolution data are essentially identical for 50 × 50 µm step size [see Supplementary Fig. S6(b)]. Icalc-based Wilson plots are shown for the ID29 100 × 100 µm and the Cristallina-MX 100 × 100 µm step-size data (see text).

IUCrJ
Volume 12| Part 6| November 2025| Pages 692-709
ISSN: 2052-2525
https://doi.org/10.1107/S2052252525008371