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Figure 1
(a) Schematic diagram of the optical layout on the NanoTerasu beamline BL10U. (b) Photograph of the experimental setup. (c) AKB mirrors installed in the vacuum chamber. (d) Ionization chamber placed between the mirror and sample chambers for monitoring incident X-ray intensity. (e) Interior of the sample chamber, showing the square apertures in front of the sample. (f) CITIUS 840k detector utilized for collecting diffraction patterns.

IUCrJ
Volume 13| Part 1| January 2026| Pages 11-18
ISSN: 2052-2525
https://doi.org/10.1107/S2052252525009236