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Figure 2
(a) Diffraction intensity pattern of the 200 nm-thick Ta test chart at 5.0 keV. (b) Reconstructed phase images of the 200 nm-thick Ta test chart at different X-ray energies. (c) Intensity distributions of the reconstructed probe functions. (d) One-dimensional intensity profiles of the main lobe of the reconstructed probe function, corresponding to the region of highest photon density at the focal spot. (e) Beam waists along the vertical (top) and horizontal (bottom) axes. The white dotted lines represent the sample position.

IUCrJ
Volume 13| Part 1| January 2026| Pages 11-18
ISSN: 2052-2525
https://doi.org/10.1107/S2052252525009236