The effect of multiple diffraction on the electron-microscope image

It is pointed out that multiple scattering in the specimen must affect the accuracy of the images produced in electron microscopes. A simple line of reasoning is offered which shows that, even with highly corrected lens systems, resolutions better than about 30 Å are unlikely to be produced for specimens of 1000 Å thickness. For increased resolution, thinner specimens or reflection microscopes should be used.