Complete determination of subgrain misorientation by an X-ray topographic method

A modification of the Berg-Barrett X-ray topographic method was developed which enables measurement of all three misorientation parameters of a general subgrain boundary. The described method is based on the evaluation of three topographs of a single, arbitrarily oriented crystal surface taken by symmetric zero-layer reflections. In practical tests performed on an as-grown Fe-3 Wt% Si single crystal, relative accuracy of 10% and angular sensitivity better than 1' were achieved.