Rapid analytic approximations for disorientation integrals in fiber diffraction

Analytic approximations for an integral to correct for the smearing of layer lines in fiber diffraction patterns due to disorientation and finite particle length have been obtained and implemented in a Fortran program. The program is fast enough to make feasible an iterative global analysis of a digitized diffraction pattern represented by thousands of data points, and some possible additional applications in this direction are outlined.