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Silica sols have been evaluated as a means of determining the incident beam intensity using position-sensitive detectors. Analysis of the total integrated small-angle X-ray scattering yielded an electron density of the suspended silica particles that was within 4% of the electron density of amorphous silica. The sols were found to be particularly well suited for use with position-sensitive detectors and represent a convenient, rapid, and accurate means to determine the incident beam intensity.
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