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A microcomputer-based method has been developed for rapid search/match analysis of X-ray diffraction patterns from compound mixtures with user-assembled data bases for specific sample types, e.g. air pollutants, asbestiform minerals, mineral sands and coal ash. Accidental coincidences between stored and measured patterns are largely eliminated using status parameters which are assigned to each data base and measured line. Scaling factors determined for each of the identified compounds afford calculation of relative concentration values. The list of unassigned lines is presented for subsequent analysis with other compact data bases or using more complex search/match methods.
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