Laue orientation and interpretation by microcomputer

This paper describes a method of indexing back-reflection Laue patterns by microcomputer which has been successfully used for the cubic system. A program using this procedure has been shown to give possible indexing schemes within 12 min. A simple method of measuring the angle between the normal to the crystal surface and a nearby symmetry pole to within ~0.1°, which does not require a highly accurately machined or perfectly aligned camera, is also described.