journal menu
computer programs
A computer program is described, which determines the indices of all crystal directions, the traces of which are visible on micrographs of arbitrary negative beam directions B. Diffraction patterns are not necessary if the indices of the foil normal and of the goniometer axis II are already known from other measurements. Otherwise these indices are determined from three diffraction patterns of arbitrary B if the relevant data are supplied to the input of the program. If the desired directions are known to lie in the plane of the foil, a single micrograph is sufficient. For directions of general orientations at least two micrographs are necessary. If there are more than two micrographs available, a mean solution vector of improved accuracy is determined for each trace and an estimate of the related error is given.
