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An X-ray diffraction method is described that determines calibration constants using only diffracted intensities and calculated phase absorption coefficients through a least-squares procedure. The conditions necessary for the application of this method are that the qualitative analysis be complete, that sufficient samples with essential differences in the quantitative phase composition be available and that the chemical compositions of the phases be known approximately. It does not require the use of pure phases or the measuring of the sample absorption coefficients. It allows the easy introduction of known calibration constants, thus reducing the number of samples needed and increasing the versatility of the method.
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