Residual stress analysis using overlapping diffraction peaks. Case of textured cubic materials

Residual stresses in polycrystalline materials can be determined from the 2θ shift of a reflection peak's line profile. Recently, multiple reflections have been used for residual stress analysis in single-phase textured cubic materials. Analogously, residual stresses in two-phase materials could be determined from overlapping peaks of both phases. Equations are derived for residual stress analysis using partially or completely overlapping diffraction peaks. Mainly textured cubic materials are considered. It is shown that the so-called quasi-isotropic diffraction elastic constants become connected to texture-dependent quantities. In the examples treated the calculated diffraction strains of three multiple reflections exhibit only small nonlinearities although the intensities oscillate strongly.