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The metastable orange crystals of HgI
comprise three different crystal structures all of which are built from corner-linked Hg
I
supertetrahedra. Two of the structures are end members with the maximum degree of order (MDO) of a polytypic layer structure. In this paper, the third structure (
D) determined from X-ray diffraction, a crystal chemical discussion of the four known tetrahedral HgI
structures, and a twinning model are presented. All the various diffraction results published during the past 70 years are now explained. The Hg
I
supertetrahedra of the tetragonal structure
D are corner-linked into two interpenetrating diamond-type networks. The stable red form and the three orange structures show the same cubic densest packing of I atoms and differ only in the distribution of Hg atoms in the tetrahedral voids. Transformations between the structures may involve only movements of Hg atoms, as implied by larger thermal displacement parameters of Hg than of I. A multiply twinned conglomerate of MDO1, MDO2 and
D, each structure occurring in three orientations, results in metrically cubic crystals whose Bragg reflections are very close to reciprocal lattice points.
Supporting information
Data collection: Stoe IPDS; cell refinement: Stoe IPDS; data reduction: Stoe IPDS; program(s) used to solve structure: SHELXS97 (Sheldrick, 1990); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: Bruker XP; software used to prepare material for publication: Bruker SHELXTL.
Crystal data top
HgI2 | Melting point: 529 K |
Mr = 454.39 | Mo Kα radiation, λ = 0.71073 Å |
Tetragonal, I41/acd | Cell parameters from 978 reflections |
a = 12.3930 (18) Å | θ = 13.9–22.4° |
c = 24.889 (5) Å | µ = 44.92 mm−1 |
V = 3822.6 (11) Å3 | T = 293 K |
Z = 32 | Block, yellow-orange |
F(000) = 5952 | 0.18 × 0.08 × 0.06 mm |
Dx = 6.316 Mg m−3 | |
Data collection top
Stoe IPDS diffractometer | 685 independent reflections |
Radiation source: fine-focus sealed tube | 455 reflections with I > 2σ(I) |
Graphite monochromator | Rint = 0.112 |
Detector resolution: 6.67 pixels mm-1 | θmax = 23.2°, θmin = 2.8° |
ϕ scans | h = 0→9 |
Absorption correction: analytical based on the shape of the crystal | k = 0→13 |
Tmin = 0.012, Tmax = 0.217 | l = 0→27 |
685 measured reflections | |
Refinement top
Refinement on F2 | 0 restraints |
Least-squares matrix: full | Primary atom site location: structure-invariant direct methods |
R[F2 > 2σ(F2)] = 0.045 | Secondary atom site location: difference Fourier map |
wR(F2) = 0.098 | w = 1/[σ2(Fo2) + (0.028P)2 + 5.8P] where P = (Fo2 + 2Fc2)/3 |
S = 1.78 | (Δ/σ)max < 0.001 |
685 reflections | Δρmax = 1.15 e Å−3 |
29 parameters | Δρmin = −1.33 e Å−3 |
Crystal data top
HgI2 | Z = 32 |
Mr = 454.39 | Mo Kα radiation |
Tetragonal, I41/acd | µ = 44.92 mm−1 |
a = 12.3930 (18) Å | T = 293 K |
c = 24.889 (5) Å | 0.18 × 0.08 × 0.06 mm |
V = 3822.6 (11) Å3 | |
Data collection top
Stoe IPDS diffractometer | 685 independent reflections |
Absorption correction: analytical based on the shape of the crystal | 455 reflections with I > 2σ(I) |
Tmin = 0.012, Tmax = 0.217 | Rint = 0.112 |
685 measured reflections | θmax = 23.2° |
Refinement top
R[F2 > 2σ(F2)] = 0.045 | 29 parameters |
wR(F2) = 0.098 | 0 restraints |
S = 1.78 | Δρmax = 1.15 e Å−3 |
685 reflections | Δρmin = −1.33 e Å−3 |
Special details top
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes)
are estimated using the full covariance matrix. The cell e.s.d.'s are taken
into account individually in the estimation of e.s.d.'s in distances, angles
and torsion angles; correlations between e.s.d.'s in cell parameters are only
used when they are defined by crystal symmetry. An approximate (isotropic)
treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s.
planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor
wR and goodness of fit S are based on F2, conventional
R-factors R are based on F, with F set to zero for
negative F2. The threshold expression of F2 >
σ(F2) is used only for calculating R-factors(gt) etc.
and is not relevant to the choice of reflections for refinement.
R-factors based on F2 are statistically about twice as large
as those based on F, and R- factors based on ALL data will be
even larger. |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | |
I2 | 0.49952 (8) | 0.51362 (11) | 0.12489 (16) | 0.0390 (5) | |
I3 | 0.5000 | 0.2500 | −0.00709 (6) | 0.0396 (6) | |
I1 | 0.2500 | 0.51427 (15) | 0.0000 | 0.0378 (6) | |
Hg | 0.37417 (6) | 0.37379 (7) | 0.06244 (3) | 0.0490 (3) | |
Atomic displacement parameters (Å2) top | U11 | U22 | U33 | U12 | U13 | U23 |
I2 | 0.0428 (10) | 0.0325 (8) | 0.0416 (7) | −0.0011 (5) | −0.0075 (5) | −0.0008 (17) |
I3 | 0.039 (2) | 0.045 (2) | 0.0349 (9) | 0.0032 (7) | 0.000 | 0.000 |
I1 | 0.0416 (16) | 0.0294 (11) | 0.0425 (10) | 0.000 | −0.0131 (6) | 0.000 |
Hg | 0.0492 (6) | 0.0490 (5) | 0.0488 (5) | 0.0031 (4) | −0.0064 (4) | 0.0053 (4) |
Geometric parameters (Å, º) top
I2—Hgi | 2.779 (3) | I1—Hgiii | 2.7953 (14) |
I2—Hg | 2.799 (2) | I1—Hg | 2.7953 (14) |
I3—Hgii | 2.7893 (13) | Hg—I2iv | 2.779 (3) |
I3—Hg | 2.7893 (13) | | |
| | | |
Hgi—I2—Hg | 103.82 (5) | I3—Hg—I1 | 107.78 (4) |
Hgii—I3—Hg | 103.31 (6) | I2iv—Hg—I2 | 111.87 (3) |
Hgiii—I1—Hg | 102.96 (7) | I3—Hg—I2 | 112.01 (5) |
I2iv—Hg—I3 | 112.77 (5) | I1—Hg—I2 | 103.22 (5) |
I2iv—Hg—I1 | 108.60 (5) | | |
Symmetry codes: (i) y+1/4, −x+3/4, −z+1/4; (ii) −x+1, −y+1/2, z; (iii) −x+1/2, y, −z; (iv) −y+3/4, x−1/4, −z+1/4. |
Experimental details
Crystal data |
Chemical formula | HgI2 |
Mr | 454.39 |
Crystal system, space group | Tetragonal, I41/acd |
Temperature (K) | 293 |
a, c (Å) | 12.3930 (18), 24.889 (5) |
V (Å3) | 3822.6 (11) |
Z | 32 |
Radiation type | Mo Kα |
µ (mm−1) | 44.92 |
Crystal size (mm) | 0.18 × 0.08 × 0.06 |
|
Data collection |
Diffractometer | Stoe IPDS diffractometer |
Absorption correction | Analytical based on the shape of the crystal |
Tmin, Tmax | 0.012, 0.217 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 685, 685, 455 |
Rint | 0.112 |
θmax (°) | 23.2 |
(sin θ/λ)max (Å−1) | 0.555 |
|
Refinement |
R[F2 > 2σ(F2)], wR(F2), S | 0.045, 0.098, 1.78 |
No. of reflections | 685 |
No. of parameters | 29 |
Δρmax, Δρmin (e Å−3) | 1.15, −1.33 |
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