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The metastable orange crystals of HgI_2 comprise three different crystal structures all of which are built from corner-linked Hg_4I_{10} supertetrahedra. Two of the structures are end members with the maximum degree of order (MDO) of a polytypic layer structure. In this paper, the third structure (D) determined from X-ray diffraction, a crystal chemical discussion of the four known tetrahedral HgI_2 structures, and a twinning model are presented. All the various diffraction results published during the past 70 years are now explained. The Hg_4I_{10} supertetrahedra of the tetragonal structure D are corner-linked into two interpenetrating diamond-type networks. The stable red form and the three orange structures show the same cubic densest packing of I atoms and differ only in the distribution of Hg atoms in the tetrahedral voids. Transformations between the structures may involve only movements of Hg atoms, as implied by larger thermal displacement parameters of Hg than of I. A multiply twinned conglomerate of MDO1, MDO2 and D, each structure occurring in three orientations, results in metrically cubic crystals whose Bragg reflections are very close to reciprocal lattice points.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768102016191/bk0120sup1.cif
Contains datablocks global, I

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768102016191/bk0120sup2.hkl
Supplementary material

Computing details top

Data collection: Stoe IPDS; cell refinement: Stoe IPDS; data reduction: Stoe IPDS; program(s) used to solve structure: SHELXS97 (Sheldrick, 1990); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: Bruker XP; software used to prepare material for publication: Bruker SHELXTL.

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
[Figure 5]
[Figure 6]
[Figure 7]
(I) top
Crystal data top
HgI2Melting point: 529 K
Mr = 454.39Mo Kα radiation, λ = 0.71073 Å
Tetragonal, I41/acdCell parameters from 978 reflections
a = 12.3930 (18) Åθ = 13.9–22.4°
c = 24.889 (5) ŵ = 44.92 mm1
V = 3822.6 (11) Å3T = 293 K
Z = 32Block, yellow-orange
F(000) = 59520.18 × 0.08 × 0.06 mm
Dx = 6.316 Mg m3
Data collection top
Stoe IPDS
diffractometer
685 independent reflections
Radiation source: fine-focus sealed tube455 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.112
Detector resolution: 6.67 pixels mm-1θmax = 23.2°, θmin = 2.8°
ϕ scansh = 09
Absorption correction: analytical
based on the shape of the crystal
k = 013
Tmin = 0.012, Tmax = 0.217l = 027
685 measured reflections
Refinement top
Refinement on F20 restraints
Least-squares matrix: fullPrimary atom site location: structure-invariant direct methods
R[F2 > 2σ(F2)] = 0.045Secondary atom site location: difference Fourier map
wR(F2) = 0.098 w = 1/[σ2(Fo2) + (0.028P)2 + 5.8P]
where P = (Fo2 + 2Fc2)/3
S = 1.78(Δ/σ)max < 0.001
685 reflectionsΔρmax = 1.15 e Å3
29 parametersΔρmin = 1.33 e Å3
Crystal data top
HgI2Z = 32
Mr = 454.39Mo Kα radiation
Tetragonal, I41/acdµ = 44.92 mm1
a = 12.3930 (18) ÅT = 293 K
c = 24.889 (5) Å0.18 × 0.08 × 0.06 mm
V = 3822.6 (11) Å3
Data collection top
Stoe IPDS
diffractometer
685 independent reflections
Absorption correction: analytical
based on the shape of the crystal
455 reflections with I > 2σ(I)
Tmin = 0.012, Tmax = 0.217Rint = 0.112
685 measured reflectionsθmax = 23.2°
Refinement top
R[F2 > 2σ(F2)] = 0.04529 parameters
wR(F2) = 0.0980 restraints
S = 1.78Δρmax = 1.15 e Å3
685 reflectionsΔρmin = 1.33 e Å3
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
I20.49952 (8)0.51362 (11)0.12489 (16)0.0390 (5)
I30.50000.25000.00709 (6)0.0396 (6)
I10.25000.51427 (15)0.00000.0378 (6)
Hg0.37417 (6)0.37379 (7)0.06244 (3)0.0490 (3)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
I20.0428 (10)0.0325 (8)0.0416 (7)0.0011 (5)0.0075 (5)0.0008 (17)
I30.039 (2)0.045 (2)0.0349 (9)0.0032 (7)0.0000.000
I10.0416 (16)0.0294 (11)0.0425 (10)0.0000.0131 (6)0.000
Hg0.0492 (6)0.0490 (5)0.0488 (5)0.0031 (4)0.0064 (4)0.0053 (4)
Geometric parameters (Å, º) top
I2—Hgi2.779 (3)I1—Hgiii2.7953 (14)
I2—Hg2.799 (2)I1—Hg2.7953 (14)
I3—Hgii2.7893 (13)Hg—I2iv2.779 (3)
I3—Hg2.7893 (13)
Hgi—I2—Hg103.82 (5)I3—Hg—I1107.78 (4)
Hgii—I3—Hg103.31 (6)I2iv—Hg—I2111.87 (3)
Hgiii—I1—Hg102.96 (7)I3—Hg—I2112.01 (5)
I2iv—Hg—I3112.77 (5)I1—Hg—I2103.22 (5)
I2iv—Hg—I1108.60 (5)
Symmetry codes: (i) y+1/4, x+3/4, z+1/4; (ii) x+1, y+1/2, z; (iii) x+1/2, y, z; (iv) y+3/4, x1/4, z+1/4.

Experimental details

Crystal data
Chemical formulaHgI2
Mr454.39
Crystal system, space groupTetragonal, I41/acd
Temperature (K)293
a, c (Å)12.3930 (18), 24.889 (5)
V3)3822.6 (11)
Z32
Radiation typeMo Kα
µ (mm1)44.92
Crystal size (mm)0.18 × 0.08 × 0.06
Data collection
DiffractometerStoe IPDS
diffractometer
Absorption correctionAnalytical
based on the shape of the crystal
Tmin, Tmax0.012, 0.217
No. of measured, independent and
observed [I > 2σ(I)] reflections
685, 685, 455
Rint0.112
θmax (°)23.2
(sin θ/λ)max1)0.555
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.045, 0.098, 1.78
No. of reflections685
No. of parameters29
Δρmax, Δρmin (e Å3)1.15, 1.33

Computer programs: Stoe IPDS, SHELXS97 (Sheldrick, 1990), SHELXL97 (Sheldrick, 1997), Bruker XP, Bruker SHELXTL.

 

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