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An accurate knowledge of zeolite structure is required for understanding their selective sorption capacities and their catalytic properties. In particular, the positions of the exchangeable cations and their interactions with the framework are essential. The present study deals with the accurate crystal structure determination of a fully exchanged and fully dehydrated CaA zeolite (Ca48Al96Si96O384, Fm\bar 3c, a = 24.47 Å) using single-crystal high-resolution synchrotron X-ray diffraction [(sin θ/λ)max = 1.4 Å−1]. It is shown that cation exchange severely distorts the skeleton, especially around the O2 atom. The high-resolution synchrotron data reveal that this latter O atom is disordered and lies out of the mirror plane it occupies in other A-type zeolites. This feature is related to that observed for Ca2+ cations.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768100006893/br0095sup1.cif
Contains datablocks hyp-a, hyp-b, hyp-c, hyp-d, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768100006893/br0095hyp-bsup2.hkl
Contains datablock II

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768100006893/br0095hyp-csup3.hkl
Contains datablock III

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768100006893/br0095hyp-dsup4.hkl
Contains datablock IV

pdf

Portable Document Format (PDF) file https://doi.org/10.1107/S0108768100006893/br0095sup5.pdf
Supplementary material

Computing details top

For all compounds, data collection: Siemens Smart; cell refinement: Siemens Smart; data reduction: Siemens Smart + SORTAV; program(s) used to solve structure: NRCVAX (Gabe et al., 1989); program(s) used to refine structure: MOLLY.

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
[Figure 5]
[Figure 6]
[Figure 7]
(hyp-a) top
Crystal data top
Al96Ca48O384Si96Z = 1
Mr = 13380.3Dx = 1.517 Mg m3
Cubic, Fm3cSynchrotron radiation, λ = 0.248 Å
Hall symbol: -F 4n 2 3T = 293 K
a = 24.47 ÅTransparent cubic crystals, colourless
V = 14652 Å30.11 × 0.10 × 0.09 mm
Data collection top
Siemens Smart CCD
diffractometer
Rint = 0.059
Radiation source: E.S.R.F.θmax = 20.3°
ω scansh = 3464
16629 measured reflectionsk = 6134
1269 independent reflectionsl = 5457
1269 reflections with I > 0
Refinement top
Refinement on FPrimary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.077w = 1/σ2
wR(F2) = 0.074(Δ/σ)max = 0.3
S = 2.96Δρmax = 6.4 e Å3
1147 reflectionsΔρmin = 1.5 e Å3
48 parameters
Crystal data top
Al96Ca48O384Si96Z = 1
Mr = 13380.3Synchrotron radiation, λ = 0.248 Å
Cubic, Fm3cT = 293 K
a = 24.47 Å0.11 × 0.10 × 0.09 mm
V = 14652 Å3
Data collection top
Siemens Smart CCD
diffractometer
1269 reflections with I > 0
16629 measured reflectionsRint = 0.059
1269 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.07748 parameters
wR(F2) = 0.074(Δ/σ)max = 0.3
S = 2.96Δρmax = 6.4 e Å3
1147 reflectionsΔρmin = 1.5 e Å3
Special details top

Geometry. All e.s.d.'s are estimated using the full covariance matrix.

Refinement. Refinement on F for all reflections with F > 0*σ(Fo). Using synchrotron radiation allows a large number (245) of substructure reflections to be observed and used for solving and refining the structure.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Si0 (0)0.09214 (6)0.18414 (5)0.0161 (6)
Al0 (0)0.18742 (5)0.09096 (7)0.0176 (6)
O10 (0)0.1088 (2)0.2460 (2)0.046 (2)
O20 (0)0.14216 (2)0.1435 (2)0.067 (3)
O30.0535 (1)0.05741 (1)0.1678 (1)0.045 (2)
Ca10.0683 (3)0.0683 (3)0.0683 (3)0.042 (2)0.15
Ca20.08698 (2)0.08698 (2)0.08698 (2)0.046 (1)0.3
Ca30.105 (2)0.0977 (3)0.109 (2)0.03 (1)0.1
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Si0.0217 (6)0.0151 (6)0.0115 (5)0 (0)0 (0)0.0051 (4)
Al0.0271 (8)0.0108 (6)0.0149 (6)0 (0)0 (0)0.0043 (5)
O10.071 (3)0.054 (2)0.012 (1)0 (0)0 (0)0.001 (2)
O20.130 (4)0.036 (3)0.036 (3)0 (0)0 (0)0.029 (2)
O30.039 (2)0.046 (2)0.051 (1)0.019 (1)0.000 (1)0.005 (1)
Ca10.042 (2)0.042 (2)0.042 (2)0.010 (3)0.010 (3)0.010 (3)
Ca20.046 (1)0.046 (1)0.046 (1)0.012 (2)0.012 (2)0.012 (2)
Ca30.03 (1)0.03 (1)0.03 (1)0.019 (6)0.002 (6)0.006 (4)
Geometric parameters (Å, º) top
Si—O11.568 (5)Ca2—O32.260 (2)
Si—O21.577 (3)Ca2—O22.875 (2)
Si—O31.611 (2)Ca3—O32.15 (4)
Al—O11.687 (5)Ca3—O32.26 (4)
Al—O21.697 (4)Ca3—O32.48 (4)
Al—O31.745 (2)Ca3—O22.69 (2)
Ca1—O32.476 (8)Ca3—O22.92 (5)
Si—O1—Al149.9 (3)O3—Si—O3108.7 (1)
Si—O2—Al169.8 (3)O1—Al—O2115.7 (2)
Si—O3—Al141.6 (2)O1—Al—O3113.7 (1)
O1—Si—O2114.0 (2)O2—Al—O3102.6 (1)
O1—Si—O3112.1 (1)O3—Al—O3107.3 (1)
O2—Si—O3104.7 (1)
(hyp-b) top
Crystal data top
Al96Ca48O384Si96Z = 1
Mr = 13380.3Dx = 1.517 Mg m3
Cubic, Fm3cSynchrotron radiation, λ = 0.248 Å
Hall symbol: -F 4n 2 3T = 293 K
a = 24.47 ÅTransparent cubic crystals, colourless
V = 14652 Å30.11 × 0.10 × 0.09 mm
Data collection top
Siemens Smart CCD
diffractometer
Rint = 0.059
Radiation source: E.S.R.F.θmax = 20.3°
ω scansh = 3464
16629 measured reflectionsk = 6134
1269 independent reflectionsl = 5457
1269 reflections with I > 0
Refinement top
Refinement on FPrimary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.070w = 1/σ2
wR(F2) = 0.067(Δ/σ)max = 0.02
S = 2.56Δρmax = 6.1 e Å3
1147 reflectionsΔρmin = 1.1 e Å3
52 parameters
Crystal data top
Al96Ca48O384Si96Z = 1
Mr = 13380.3Synchrotron radiation, λ = 0.248 Å
Cubic, Fm3cT = 293 K
a = 24.47 Å0.11 × 0.10 × 0.09 mm
V = 14652 Å3
Data collection top
Siemens Smart CCD
diffractometer
1269 reflections with I > 0
16629 measured reflectionsRint = 0.059
1269 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.07052 parameters
wR(F2) = 0.067Δρmax = 6.1 e Å3
S = 2.56Δρmin = 1.1 e Å3
1147 reflections
Special details top

Geometry. All e.s.d.'s are estimated using the full covariance matrix.

Refinement. Refinement on F for all reflections with F > 0*σ(Fo). Using synchrotron radiation allows a large number (183) of substructure reflections to be observed and used for solving and refining the structure.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Si0.00000 (1)0.09216 (6)0.18413 (5)0.01648 (5)
Al0.00000 (1)0.18738 (5)0.09095 (6)0.0180 (6)
O10.00000 (1)0.1088 (1)0.2460 (2)0.047 (2)
O20.0115 (1)0.1423 (2)0.1436 (2)0.031 (3)0.5
O30.0539 (1)0.0577 (1)0.1676 (1)0.045 (2)
Ca10.0685 (1)0.0685 (1)0.0685 (1)0.040 (2)0.15
Ca20.0874 (2)0.0874 (2)0.0874 (2)0.0446 (1)0.3
Ca30.1052 (9)0.0977 (2)0.1090 (9)0.023 (4)0.1
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Si0.02197 (6)0.01516 (5)0.01230 (5)0.00000 (1)0.00000 (1)0.0051 (4)
Al0.0277 (7)0.0112 (5)0.0151 (6)0.00000 (1)0.00000 (1)0.00455 (5)
O10.076 (2)0.053 (2)0.013 (1)0.00000 (1)0.00000 (1)0.002 (2)
O20.033 (2)0.024 (3)0.036 (3)0.008 (2)0.007 (2)0.027 (1)
O30.039 (2)0.046 (2)0.051 (1)0.020 (1)0.001 (1)0.006 (1)
Ca10.040 (2)0.040 (2)0.040 (2)0.010 (2)0.010 (2)0.010 (2)
Ca20.0446 (1)0.0446 (1)0.0446 (1)0.013 (1)0.013 (1)0.013 (1)
Ca30.040 (7)0.011 (2)0.017 (3)0.020 (4)0.003 (3)0.004 (3)
Geometric parameters (Å, º) top
Si—O11.568 (5)Ca1—O32.465 (3)
Si—O21.603 (5)Ca2—O32.248 (5)
Si—O31.617 (3)Ca3—O32.14 (2)
Al—O11.688 (5)Ca3—O32.25 (2)
Al—O21.719 (5)Ca3—O32.47 (2)
Al—O31.746 (3)
Si—O1—Al150.0 (2)O3—Si—O3109.3 (2)
Si—O2—Al157.9 (2)O1—Al—O2115.2 (2)
Si—O3—Al140.9 (2)O1—Al—O3113.7 (1)
O1—Si—O2113.5 (2)O2—Al—O3110.1 (2)
O1—Si—O3112.2 (1)O2—Al—O394.5 (2)
O2—Si—O395.8 (2)O3—Al—O3107.9 (1)
O2—Si—O3112.8 (2)
(hyp-c) top
Crystal data top
Al96Ca48O384Si96Z = 1
Mr = 13380.3Dx = 1.517 Mg m3
Cubic, Fm3cSynchrotron radiation, λ = 0.248 Å
Hall symbol: -F 4n 2 3T = 293 K
a = 24.47 ÅTransparent cubic crystals, colourless
V = 14652 Å30.11 × 0.10 × 0.09 mm
Data collection top
Siemens Smart CCD
diffractometer
Rint = 5.93
Radiation source: E.S.R.F.θmax = 20.3°
ω scansh = 3464
16629 measured reflectionsk = 6134
1269 independent reflectionsl = 5457
1269 reflections with I > 0
Refinement top
Refinement on FPrimary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.066w = 1/σ2
wR(F2) = 0.062(Δ/σ)max = 0.02
S = 2.38Δρmax = 1.4 e Å3
1147 reflectionsΔρmin = 1.4 e Å3
57 parameters
Crystal data top
Al96Ca48O384Si96Z = 1
Mr = 13380.3Synchrotron radiation, λ = 0.248 Å
Cubic, Fm3cT = 293 K
a = 24.47 Å0.11 × 0.10 × 0.09 mm
V = 14652 Å3
Data collection top
Siemens Smart CCD
diffractometer
1269 reflections with I > 0
16629 measured reflectionsRint = 5.93
1269 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.06657 parameters
wR(F2) = 0.062Δρmax = 1.4 e Å3
S = 2.38Δρmin = 1.4 e Å3
1147 reflections
Special details top

Geometry. All e.s.d.'s are estimated using the full covariance matrix.

Refinement. Refinement on F for all reflections with F > 0*σ(Fo). Using synchrotron radiation allows a large number (245) of substructure reflections to be observed and used for solving and refining the structure.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Si00.09216 (5)0.18412 (4)0.01648 (5)
Al00.18738 (4)0.09095 (6)0.0180 (6)
O100.1087 (1)0.2460 (1)0.047 (2)
O20.0115 (1)0.1423 (2)0.1436 (2)0.031 (3)0.5
O30.0539 (1)0.0576 (1)0.16765 (9)0.045 (2)
Ca10.0718 (9)0.0718 (9)0.0718 (9)0.040 (2)0.25 (2)
Ca20.0874 (3)0.0874 (3)0.0874 (3)0.0446 (1)0.17 (2)
Ca30.1050 (7)0.0972 (3)0.1069 (8)0.023 (4)0.124 (3)
Ca40 (0)0 (0)0 (0)0.02 (1)*0.08 (1)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Si0.0218 (5)0.0150 (5)0.0123 (5)000.0051 (4)
Al0.0275 (6)0.0111 (5)0.0151 (5)000.0046 (4)
O10.074 (2)0.053 (2)0.013 (1)000.002 (2)
O20.033 (2)0.034 (2)0.035 (2)0.008 (2)0.007 (2)0.026 (2)
O30.040 (2)0.046 (2)0.050 (1)0.0194 (9)0.001 (1)0.006 (1)
Ca10.072 (7)0.072 (7)0.072 (7)0.037 (7)0.037 (7)0.037 (7)
Ca20.027 (3)0.027 (3)0.027 (3)0.003 (2)0.003 (2)0.003 (2)
Ca30.055 (7)0.020 (3)0.026 (4)0.027 (4)0.000 (3)0.006 (3)
Geometric parameters (Å, º) top
Si—O11.568 (5)Ca1—O32.465 (3)
Si—O21.603 (5)Ca2—O32.248 (5)
Si—O31.617 (3)Ca3—O32.14 (2)
Al—O11.688 (5)Ca3—O32.25 (2)
Al—O21.719 (5)Ca3—O32.47 (2)
Al—O31.746 (3)
Si—O1—Al150.0 (2)O3—Si—O3109.3 (2)
Si—O2—Al157.9 (2)O1—Al—O2115.2 (2)
Si—O3—Al140.9 (2)O1—Al—O3113.7 (1)
O1—Si—O2113.5 (2)O2—Al—O3110.1 (2)
O1—Si—O3112.2 (1)O2—Al—O394.5 (2)
O2—Si—O395.8 (2)O3—Al—O3107.9 (1)
O2—Si—O3112.8 (2)
(hyp-d) top
Crystal data top
Al96Ca48O384Si96Z = 1
Mr = 13380.3Dx = 1.517 Mg m3
Cubic, F43cSynchrotron radiation, λ = 0.248 Å
Hall symbol: F -4c 2 3T = 293 K
a = 24.47 ÅTransparent cubic crystals, colourless
V = 14652 Å30.11 × 0.10 × 0.09 mm
Data collection top
Siemens Smart CCD
diffractometer
Rint = 5.93
Radiation source: E.S.R.F.θmax = 20.3°
ω scansh = 3464
16629 measured reflectionsk = 6134
1269 independent reflectionsl = 5457
1269 reflections with I > 0
Refinement top
Refinement on FPrimary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.070w = 1/σ2
wR(F2) = 0.067(Δ/σ)max = 0.2
S = 2.45Δρmax = 6.5 e Å3
1147 reflectionsΔρmin = 1.2 e Å3
78 parameters
Crystal data top
Al96Ca48O384Si96Z = 1
Mr = 13380.3Synchrotron radiation, λ = 0.248 Å
Cubic, F43cT = 293 K
a = 24.47 Å0.11 × 0.10 × 0.09 mm
V = 14652 Å3
Data collection top
Siemens Smart CCD
diffractometer
1269 reflections with I > 0
16629 measured reflectionsRint = 5.93
1269 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.07078 parameters
wR(F2) = 0.067(Δ/σ)max = 0.2
S = 2.45Δρmax = 6.5 e Å3
1147 reflectionsΔρmin = 1.2 e Å3
Special details top

Geometry. All e.s.d.'s are estimated using the full covariance matrix.

Refinement. Refinement on F for all reflections with F > 0*σ(Fo). Using synchrotron radiation allows a large number (245) of substructure reflections to be observed and used for solving and refining the structure.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Si0.0006 (2)0.09217 (6)0.18416 (5)0.0168 (6)
Al0.0007 (2)0.18732 (5)0.09098 (7)0.0180 (6)
O10.0011 (7)0.1085 (2)0.2462 (2)0.049 (2)
O2a0.0120 (6)0.1394 (5)0.1409 (6)0.030 (6)0.5
O2b0.0102 (6)0.1468 (7)0.1478 (7)0.036 (8)0.5
O3a0.0557 (4)0.0574 (4)0.1647 (3)0.040 (5)
O3b0.0524 (4)0.0579 (4)0.1709 (3)0.045 (5)
Ca10.0689 (3)0.0689 (3)0.0689 (3)0.048 (2)0.25 (2)
Ca20.0858 (3)0.0858 (3)0.0858 (3)0.045 (2)0.17 (2)
Ca3a0.0975 (4)0.0975 (4)0.0975 (4)0.062 (4)0.124 (3)
Ca3b0.1011 (7)0.0997 (7)0.1127 (3)0.017 (1)*0.08 (1)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Si0.0222 (6)0.0159 (6)0.0124 (5)0.008 (1)0.003 (1)0.0054 (4)
Al0.0279 (7)0.0114 (6)0.0147 (6)0.000 (2)0.000 (2)0.0040 (5)
O10.078 (3)0.055 (2)0.014 (1)0.014 (7)0.013 (5)0.002 (2)
O2a0.044 (6)0.015 (4)0.031 (6)0.016 (4)0.022 (5)0.016 (2)
O2b0.028 (7)0.05 (1)0.031 (7)0.001 (7)0.006 (6)0.025 (4)
O3a0.042 (5)0.039 (6)0.039 (3)0.014 (3)0.004 (3)0.003 (3)
O3b0.034 (4)0.053 (6)0.049 (4)0.028 (3)0.000 (3)0.010 (3)
Ca10.048 (2)0.048 (2)0.048 (2)0.022 (3)0.022 (3)0.022 (3)
Ca20.045 (2)0.045 (2)0.045 (2)0.008 (2)0.008 (2)0.008 (2)
Ca3a0.062 (4)0.062 (4)0.062 (4)0.036 (5)0.036 (5)0.036 (5)

Experimental details

(hyp-a)(hyp-b)(hyp-c)(hyp-d)
Crystal data
Chemical formulaAl96Ca48O384Si96Al96Ca48O384Si96Al96Ca48O384Si96Al96Ca48O384Si96
Mr13380.313380.313380.313380.3
Crystal system, space groupCubic, Fm3cCubic, Fm3cCubic, Fm3cCubic, F43c
Temperature (K)293293293293
a (Å)24.47 24.47 24.47 24.47
V3)14652146521465214652
Z1111
Radiation typeSynchrotron, λ = 0.248 ÅSynchrotron, λ = 0.248 ÅSynchrotron, λ = 0.248 ÅSynchrotron, λ = 0.248 Å
µ (mm1)????
Crystal size (mm)0.11 × 0.10 × 0.090.11 × 0.10 × 0.090.11 × 0.10 × 0.090.11 × 0.10 × 0.09
Data collection
DiffractometerSiemens Smart CCD
diffractometer
Siemens Smart CCD
diffractometer
Siemens Smart CCD
diffractometer
Siemens Smart CCD
diffractometer
Absorption correction????
No. of measured, independent and
observed (I > 0) reflections
16629, 1269, 1269 16629, 1269, 1269 16629, 1269, 1269 16629, 1269, 1269
Rint0.0590.0595.935.93
(sin θ/λ)max1)1.4001.4001.4001.400
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.077, 0.074, 2.96 0.070, 0.067, 2.56 0.066, 0.062, 2.38 0.070, 0.067, 2.45
No. of reflections1147114711471147
No. of parameters48525778
No. of restraints????
(Δ/σ)max0.30.020.020.2
Δρmax, Δρmin (e Å3)6.4, 1.56.1, 1.11.4, 1.46.5, 1.2

Computer programs: , Siemens Smart + SORTAV, NRCVAX (Gabe et al., 1989), MOLLY.

Selected geometric parameters (Å, º) for (hyp-a) top
Si—O11.568 (5)Ca2—O32.260 (2)
Si—O21.577 (3)Ca2—O22.875 (2)
Si—O31.611 (2)Ca3—O32.15 (4)
Al—O11.687 (5)Ca3—O32.26 (4)
Al—O21.697 (4)Ca3—O32.48 (4)
Al—O31.745 (2)Ca3—O22.69 (2)
Ca1—O32.476 (8)Ca3—O22.92 (5)
Si—O1—Al149.9 (3)O3—Si—O3108.7 (1)
Si—O2—Al169.8 (3)O1—Al—O2115.7 (2)
Si—O3—Al141.6 (2)O1—Al—O3113.7 (1)
O1—Si—O2114.0 (2)O2—Al—O3102.6 (1)
O1—Si—O3112.1 (1)O3—Al—O3107.3 (1)
O2—Si—O3104.7 (1)
Selected geometric parameters (Å, º) for (hyp-b) top
Si—O11.568 (5)Ca1—O32.465 (3)
Si—O21.603 (5)Ca2—O32.248 (5)
Si—O31.617 (3)Ca3—O32.14 (2)
Al—O11.688 (5)Ca3—O32.25 (2)
Al—O21.719 (5)Ca3—O32.47 (2)
Al—O31.746 (3)
Si—O1—Al150.0 (2)O3—Si—O3109.3 (2)
Si—O2—Al157.9 (2)O1—Al—O2115.2 (2)
Si—O3—Al140.9 (2)O1—Al—O3113.7 (1)
O1—Si—O2113.5 (2)O2—Al—O3110.1 (2)
O1—Si—O3112.2 (1)O2—Al—O394.5 (2)
O2—Si—O395.8 (2)O3—Al—O3107.9 (1)
O2—Si—O3112.8 (2)
Selected geometric parameters (Å, º) for (hyp-c) top
Si—O11.568 (5)Ca1—O32.465 (3)
Si—O21.603 (5)Ca2—O32.248 (5)
Si—O31.617 (3)Ca3—O32.14 (2)
Al—O11.688 (5)Ca3—O32.25 (2)
Al—O21.719 (5)Ca3—O32.47 (2)
Al—O31.746 (3)
Si—O1—Al150.0 (2)O3—Si—O3109.3 (2)
Si—O2—Al157.9 (2)O1—Al—O2115.2 (2)
Si—O3—Al140.9 (2)O1—Al—O3113.7 (1)
O1—Si—O2113.5 (2)O2—Al—O3110.1 (2)
O1—Si—O3112.2 (1)O2—Al—O394.5 (2)
O2—Si—O395.8 (2)O3—Al—O3107.9 (1)
O2—Si—O3112.8 (2)
 

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