

Supporting information
![]() | Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807058059/bt2603sup1.cif |
![]() | Structure factor file (CIF format) https://doi.org/10.1107/S1600536807058059/bt2603Isup2.hkl |
CCDC reference: 672958
Key indicators
- Single-crystal X-ray study
- T = 295 K
- Mean
(S-O) = 0.002 Å
- R factor = 0.033
- wR factor = 0.092
- Data-to-parameter ratio = 13.5
checkCIF/PLATON results
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Alert level C PLAT042_ALERT_1_C Calc. and Rep. MoietyFormula Strings Differ .... ?
0 ALERT level A = In general: serious problem 0 ALERT level B = Potentially serious problem 1 ALERT level C = Check and explain 0 ALERT level G = General alerts; check 1 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 0 ALERT type 2 Indicator that the structure model may be wrong or deficient 0 ALERT type 3 Indicator that the structure quality may be low 0 ALERT type 4 Improvement, methodology, query or suggestion 0 ALERT type 5 Informative message, check
S-Methylisothiourea sulfate was synthesized in a modified literature procedure (Arndt 1921). Dimethylsulfate Me2SO4 (6.30 g, 49.95 mmol) was slowly added to a slurry of thiourea (NH2)2CS (7.60 g, 99.84 mmol) in 150 ml of water. The reaction mixture was stirred for 5 min at room temperature and then heated first to 30°C for 1.5 h and afterwards to 100°C under reflux. The solvent was destilled off. The colourless crystalline residue was washed with twice the volume of the crystalline residue of a mixture consisting of ethanole and water (10:1). The mixture was stirred for 5 min, filtrated and the crystalline solid dried in vacuo. Yield: 12.35 g (44.36 mmol, 44.5%). Anal. calc. (found) for C4H14N4O4S3: C 17.26 (17.14), H 5.07 (5.20), N 20.13 (20.02), S 34.56 (33.52)%. 1H-NMR (CDCl3, 25°C): δ = 2.41 (s, 3H, CH3), 4.63 (s, 4 H, H2NCNH2). 13C{1H}-NMR: δ = 172.89 (s, H2NCNH2), 12.96 (s, CH3). 14N-NMR: δ = - 280.22. IR (KBr, cm-1): ν = 3989 w, 3903 w, 3840 w, 3799 w, 3748 w, 3736 w, 3673 w, 3650 w, 3211 versus, 3030 versus, 2802 s, 2367 ms, 2291 m, 2103 w, 2052 w, 1682 versus (nsym C=N), 1564 s, 1438 s, 1419 s, 1321 m, 1150 s, 1127 s, 1078 s, 982 s, 732 s, 698 s, 602 s, 482 s, 429 m. Raman (200 mW, 25°C, cm-1): ν = 3029 (11), 3009 (11), 2944 (33), 1678 (5) (nsym C=N), 1436 (19), 1423 (16), 1326 (6), 1148 (40), 1133 (24), 1117 (31), 1075 (17), 976 (100), 733 (12), 702 (67), 603 (12), 485 (42), 431 (73), 268 (14), 146 (58). MS (FAB, 70 eV, NBA-Matrix, >5%); m/z: 359 (8), 91 (20) [M+], 89 (16) [(M - 2 H)+]. Crystallization from a saturated ethanole/water (10:1) solution at ambient temperature gave colourless X-ray quality crystals.
H atoms bonded to N atoms were located in a difference map and refined freely. Other H atoms were positioned geometrically and refined using a riding model (including free rotation about the S1—C2 bond), with C—H = 0.96 Å and with Uiso(H) = 1.5 times Ueq(C).
Data collection: CAD-4 Software (Enraf–Nonius, 1994); cell refinement: CAD-4 Software (Enraf–Nonius, 1994); data reduction: OpenMolEN (Enraf–Nonius, 1997); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEPIII (Burnett & Johnson, 1996) and DIAMOND (Brandenburg, 2005); software used to prepare material for publication: SHELXL97 (Sheldrick, 1997.
2C2H7N2S+·SO42− | F(000) = 584 |
Mr = 278.37 | Dx = 1.544 Mg m−3 |
Orthorhombic, Pbcn | Mo Kα radiation, λ = 0.71073 Å |
Hall symbol: -P 2n 2ab | Cell parameters from 25 reflections |
a = 11.3250 (19) Å | θ = 9–18° |
b = 8.3903 (18) Å | µ = 0.62 mm−1 |
c = 12.6041 (17) Å | T = 295 K |
V = 1197.6 (4) Å3 | Block, colourless |
Z = 4 | 0.57 × 0.53 × 0.47 mm |
Nonius MACH3 diffractometer | 1098 reflections with I > 2σ(I) |
Radiation source: fine-focus sealed tube | Rint = 0.006 |
Graphite monochromator | θmax = 26.0°, θmin = 3.0° |
ο–2T–scan | h = −13→0 |
Absorption correction: ψ scan (North et al., 1968) | k = −10→0 |
Tmin = 0.717, Tmax = 0.749 | l = 0→15 |
1175 measured reflections | 3 standard reflections every 7200 min |
1173 independent reflections | intensity decay: −0.7% |
Refinement on F2 | Secondary atom site location: difference Fourier map |
Least-squares matrix: full | Hydrogen site location: inferred from neighbouring sites |
R[F2 > 2σ(F2)] = 0.033 | H atoms treated by a mixture of independent and constrained refinement |
wR(F2) = 0.092 | w = 1/[σ2(Fo2) + (0.0501P)2 + 0.8658P] where P = (Fo2 + 2Fc2)/3 |
S = 1.08 | (Δ/σ)max < 0.001 |
1173 reflections | Δρmax = 0.61 e Å−3 |
87 parameters | Δρmin = −0.36 e Å−3 |
0 restraints | Extinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4 |
Primary atom site location: structure-invariant direct methods | Extinction coefficient: 0.065 (4) |
2C2H7N2S+·SO42− | V = 1197.6 (4) Å3 |
Mr = 278.37 | Z = 4 |
Orthorhombic, Pbcn | Mo Kα radiation |
a = 11.3250 (19) Å | µ = 0.62 mm−1 |
b = 8.3903 (18) Å | T = 295 K |
c = 12.6041 (17) Å | 0.57 × 0.53 × 0.47 mm |
Nonius MACH3 diffractometer | 1098 reflections with I > 2σ(I) |
Absorption correction: ψ scan (North et al., 1968) | Rint = 0.006 |
Tmin = 0.717, Tmax = 0.749 | 3 standard reflections every 7200 min |
1175 measured reflections | intensity decay: −0.7% |
1173 independent reflections |
R[F2 > 2σ(F2)] = 0.033 | 0 restraints |
wR(F2) = 0.092 | H atoms treated by a mixture of independent and constrained refinement |
S = 1.08 | Δρmax = 0.61 e Å−3 |
1173 reflections | Δρmin = −0.36 e Å−3 |
87 parameters |
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | ||
S1 | 0.73533 (5) | 0.62211 (8) | 0.47370 (5) | 0.0500 (3) | |
N1 | 0.69384 (17) | 0.7584 (3) | 0.65367 (14) | 0.0402 (5) | |
H1 | 0.660 (2) | 0.820 (3) | 0.694 (2) | 0.043 (7)* | |
H2 | 0.760 (3) | 0.722 (3) | 0.666 (2) | 0.049 (7)* | |
N2 | 0.54254 (16) | 0.7861 (2) | 0.53413 (15) | 0.0341 (4) | |
H3 | 0.507 (2) | 0.840 (3) | 0.577 (2) | 0.045 (7)* | |
H4 | 0.518 (3) | 0.783 (3) | 0.469 (2) | 0.051 (8)* | |
C1 | 0.64701 (17) | 0.7327 (2) | 0.56010 (15) | 0.0312 (4) | |
C2 | 0.6354 (2) | 0.5513 (3) | 0.37475 (19) | 0.0451 (6) | |
H5 | 0.6748 | 0.4749 | 0.3305 | 0.054* | |
H6 | 0.6088 | 0.6391 | 0.3322 | 0.054* | |
H7 | 0.5688 | 0.5018 | 0.4084 | 0.054* | |
S2 | 0.5000 | 0.92901 (8) | 0.2500 | 0.0240 (2) | |
O1 | 0.58511 (12) | 1.03141 (18) | 0.30668 (11) | 0.0384 (4) | |
O2 | 0.43656 (12) | 0.82932 (19) | 0.32713 (10) | 0.0358 (4) |
U11 | U22 | U33 | U12 | U13 | U23 | |
S1 | 0.0339 (4) | 0.0703 (5) | 0.0460 (4) | 0.0141 (3) | 0.0011 (2) | −0.0210 (3) |
N1 | 0.0311 (9) | 0.0572 (12) | 0.0322 (9) | 0.0152 (9) | −0.0035 (8) | −0.0054 (8) |
N2 | 0.0295 (9) | 0.0469 (10) | 0.0259 (9) | 0.0075 (8) | 0.0003 (7) | −0.0028 (7) |
C1 | 0.0275 (9) | 0.0376 (10) | 0.0285 (9) | 0.0024 (7) | 0.0036 (7) | 0.0017 (8) |
C2 | 0.0492 (13) | 0.0477 (12) | 0.0385 (11) | 0.0041 (10) | 0.0003 (10) | −0.0080 (9) |
S2 | 0.0186 (3) | 0.0364 (4) | 0.0170 (3) | 0.000 | 0.0003 (2) | 0.000 |
O1 | 0.0327 (7) | 0.0537 (9) | 0.0289 (7) | −0.0127 (7) | −0.0031 (6) | −0.0053 (6) |
O2 | 0.0283 (7) | 0.0522 (8) | 0.0270 (7) | −0.0070 (6) | 0.0040 (5) | 0.0072 (6) |
S1—C1 | 1.7459 (19) | C2—H5 | 0.9600 |
S1—C2 | 1.786 (2) | C2—H6 | 0.9600 |
N1—C1 | 1.311 (3) | C2—H7 | 0.9600 |
N1—H1 | 0.82 (3) | S2—O2i | 1.4699 (13) |
N1—H2 | 0.82 (3) | S2—O2 | 1.4699 (13) |
N2—C1 | 1.307 (3) | S2—O1 | 1.4756 (14) |
N2—H3 | 0.81 (3) | S2—O1i | 1.4756 (14) |
N2—H4 | 0.86 (3) | ||
C1—S1—C2 | 104.44 (10) | S1—C2—H6 | 109.5 |
C1—N1—H1 | 118.3 (18) | H5—C2—H6 | 109.5 |
C1—N1—H2 | 118.7 (19) | S1—C2—H7 | 109.5 |
H1—N1—H2 | 122 (3) | H5—C2—H7 | 109.5 |
C1—N2—H3 | 118.5 (19) | H6—C2—H7 | 109.5 |
C1—N2—H4 | 121.1 (19) | O2i—S2—O2 | 110.64 (13) |
H3—N2—H4 | 119 (3) | O2i—S2—O1 | 109.40 (8) |
N2—C1—N1 | 122.37 (19) | O2—S2—O1 | 109.29 (8) |
N2—C1—S1 | 123.00 (16) | O2i—S2—O1i | 109.29 (8) |
N1—C1—S1 | 114.63 (15) | O2—S2—O1i | 109.40 (8) |
S1—C2—H5 | 109.5 | O1—S2—O1i | 108.79 (13) |
C2—S1—C1—N2 | −18.4 (2) | N1—N2—C1—S1 | −180.0 (3) |
C2—S1—C1—N1 | 161.61 (17) |
Symmetry code: (i) −x+1, y, −z+1/2. |
D—H···A | D—H | H···A | D···A | D—H···A |
N2—H4···O2 | 0.86 (3) | 2.05 (3) | 2.895 (2) | 165 (3) |
N2—H3···O1ii | 0.81 (3) | 2.10 (3) | 2.908 (2) | 177 (3) |
N1—H1···O1iii | 0.82 (3) | 2.08 (3) | 2.889 (2) | 175 (2) |
N1—H2···O2iv | 0.82 (3) | 2.05 (3) | 2.856 (2) | 167 (3) |
Symmetry codes: (ii) −x+1, −y+2, −z+1; (iii) x, −y+2, z+1/2; (iv) x+1/2, −y+3/2, −z+1. |
Experimental details
Crystal data | |
Chemical formula | 2C2H7N2S+·SO42− |
Mr | 278.37 |
Crystal system, space group | Orthorhombic, Pbcn |
Temperature (K) | 295 |
a, b, c (Å) | 11.3250 (19), 8.3903 (18), 12.6041 (17) |
V (Å3) | 1197.6 (4) |
Z | 4 |
Radiation type | Mo Kα |
µ (mm−1) | 0.62 |
Crystal size (mm) | 0.57 × 0.53 × 0.47 |
Data collection | |
Diffractometer | Nonius MACH3 diffractometer |
Absorption correction | ψ scan (North et al., 1968) |
Tmin, Tmax | 0.717, 0.749 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 1175, 1173, 1098 |
Rint | 0.006 |
(sin θ/λ)max (Å−1) | 0.616 |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | 0.033, 0.092, 1.08 |
No. of reflections | 1173 |
No. of parameters | 87 |
H-atom treatment | H atoms treated by a mixture of independent and constrained refinement |
Δρmax, Δρmin (e Å−3) | 0.61, −0.36 |
Computer programs: CAD-4 Software (Enraf–Nonius, 1994), OpenMolEN (Enraf–Nonius, 1997), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), ORTEPIII (Burnett & Johnson, 1996) and DIAMOND (Brandenburg, 2005), SHELXL97 (Sheldrick, 1997.
S1—C1 | 1.7459 (19) | S2—O2 | 1.4699 (13) |
S1—C2 | 1.786 (2) | S2—O1 | 1.4756 (14) |
N1—C1 | 1.311 (3) | ||
C1—S1—C2 | 104.44 (10) | O2i—S2—O2 | 110.64 (13) |
N2—C1—N1 | 122.37 (19) | O2i—S2—O1 | 109.40 (8) |
N2—C1—S1 | 123.00 (16) | O2—S2—O1 | 109.29 (8) |
N1—C1—S1 | 114.63 (15) | O1—S2—O1i | 108.79 (13) |
Symmetry code: (i) −x+1, y, −z+1/2. |
D—H···A | D—H | H···A | D···A | D—H···A |
N2—H4···O2 | 0.86 (3) | 2.05 (3) | 2.895 (2) | 165 (3) |
N2—H3···O1ii | 0.81 (3) | 2.10 (3) | 2.908 (2) | 177 (3) |
N1—H1···O1iii | 0.82 (3) | 2.08 (3) | 2.889 (2) | 175 (2) |
N1—H2···O2iv | 0.82 (3) | 2.05 (3) | 2.856 (2) | 167 (3) |
Symmetry codes: (ii) −x+1, −y+2, −z+1; (iii) x, −y+2, z+1/2; (iv) x+1/2, −y+3/2, −z+1. |

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The S-Methyl-thiuronium cation exhibits an almost planar thiourea-unit (r.m.s. deviation for N1,N2,C1,S1 = 0.0004 Å), the methyl-group differs from planarity to a considerable degree (C2—S1—C1—N2 - 18.4 (2)°). In the sulfate anion the coordination of the sulfur atom by the four oxygen atoms can be considered as slightly distorted tetrahedral, with O—S—O bond angles in the range 108.79 (13)–110.64 (13)° (Fig.1).
In the crystal structure, each C2H7N2S+ cation is linked to two SO4- anions by four N—H···O hydrogen-bonds (Fig.2) with relatively short donor-acceptor distances (Tab.2).