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Cu/Zn disorder in the kesterite Cu
2ZnSnS
4 derivatives used for thin film based solar cells is an important issue for photovoltaic performances. Unfortunately, Cu and Zn cannot be distinguished by conventional laboratory X-ray diffraction. This paper reports on a resonant diffraction investigation of a Cu
2ZnSnS
4 single crystal from a quenched powdered sample. The full disorder of Cu and Zn in the
z = 1/4 atomic plane is shown. The structure, namely disordered kesterite, is then described in the

space group.
Supporting information
CCDC reference: 986377
Crystal data, data collection and structure refinement details are summarized
in Table 1.
S2. Results and discussion
top
Data collection: unknown; cell refinement: unknown; data reduction: unknown; program(s) used to solve structure: unknown; molecular graphics: unknown.
Crystal data top
| Cu2S4SnZn | Z = 2 |
| Mr = 439.4 | F(000) = 404 |
| Tetragonal, I42m | Dx = 4.553 Mg m−3 |
| Hall symbol: I -4 2 | ? radiation, λ = 0.66842 Å |
| a = 5.4353 (1) Å | µ = 12.84 mm−1 |
| c = 10.8464 (3) Å | T = 293 K |
| V = 320.43 (1) Å3 | 0.08 × 0.05 × 0.05 mm |
Data collection top
| Radiation source: synchrotron | Rint = 0.088 |
Absorption correction: empirical (using intensity measurements) ? | θmax = 34.7°, θmin = 3.5° |
| Tmin = 0.91, Tmax = 1.10 | h = −6→8 |
| 5275 measured reflections | k = −9→9 |
| 449 independent reflections | l = −18→18 |
| 449 reflections with I > 2σ(I) | |
Refinement top
| Refinement on F2 | 2 constraints |
| R[F2 > 2σ(F2)] = 0.029 | Weighting scheme based on measured s.u.'s w = 1/(σ2(I) + 0.0016I2) |
| wR(F2) = 0.074 | (Δ/σ)max = 0.004 |
| S = 1.60 | Δρmax = 1.39 e Å−3 |
| 449 reflections | Δρmin = −2.17 e Å−3 |
| 15 parameters | Extinction correction: B-C type 1 Gaussian isotropic (Becker & Coppens, 1974) |
| 0 restraints | Extinction coefficient: 1900 (150) |
Crystal data top
| Cu2S4SnZn | Z = 2 |
| Mr = 439.4 | ? radiation, λ = 0.66842 Å |
| Tetragonal, I42m | µ = 12.84 mm−1 |
| a = 5.4353 (1) Å | T = 293 K |
| c = 10.8464 (3) Å | 0.08 × 0.05 × 0.05 mm |
| V = 320.43 (1) Å3 | |
Data collection top
Absorption correction: empirical (using intensity measurements) ? | 449 independent reflections |
| Tmin = 0.91, Tmax = 1.10 | 449 reflections with I > 2σ(I) |
| 5275 measured reflections | Rint = 0.088 |
Refinement top
| R[F2 > 2σ(F2)] = 0.029 | 15 parameters |
| wR(F2) = 0.074 | 0 restraints |
| S = 1.60 | Δρmax = 1.39 e Å−3 |
| 449 reflections | Δρmin = −2.17 e Å−3 |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top| | x | y | z | Uiso*/Ueq | Occ. (<1) |
| Cu_2a | 0 | 0 | 0 | 0.01903 (16) | |
| Cu_4d | 0 | 0.5 | 0.25 | 0.01688 (13) | 0.5 |
| Zn_4d | 0 | 0.5 | 0.25 | 0.01688 (13) | 0.5 |
| Sn_2b | 0 | 0 | 0.5 | 0.01077 (9) | |
| S | 0.75608 (10) | 0.24393 (10) | 0.12788 (5) | 0.0112 (2) | |
Atomic displacement parameters (Å2) top| | U11 | U22 | U33 | U12 | U13 | U23 |
| Cu_2a | 0.0194 (2) | 0.0194 (2) | 0.0183 (3) | 0 | 0 | 0 |
| Cu_4d | 0.0170 (2) | 0.0170 (2) | 0.0166 (3) | 0 | 0 | 0 |
| Zn_4d | 0.0170 (2) | 0.0170 (2) | 0.0166 (3) | 0 | 0 | 0 |
| Sn_2b | 0.01111 (15) | 0.01111 (15) | 0.01008 (17) | 0 | 0 | 0 |
| S | 0.0114 (3) | 0.0114 (3) | 0.0108 (4) | 0.00056 (18) | −0.00023 (13) | 0.00023 (13) |
Geometric parameters (Å, º) top
| Cu_2a—Si | 2.3322 (6) | Zn_4d—Si | 2.3344 (5) |
| Cu_2a—Sii | 2.3322 (6) | Zn_4d—Sv | 2.3344 (5) |
| Cu_2a—Siii | 2.3322 (6) | Zn_4d—Svi | 2.3344 (5) |
| Cu_2a—Siv | 2.3322 (6) | Zn_4d—Svii | 2.3344 (5) |
| Cu_4d—Zn_4d | 0 | Sn_2b—Sviii | 2.4080 (6) |
| Cu_4d—Si | 2.3344 (5) | Sn_2b—Six | 2.4080 (6) |
| Cu_4d—Sv | 2.3344 (5) | Sn_2b—Sx | 2.4080 (6) |
| Cu_4d—Svi | 2.3344 (5) | Sn_2b—Svii | 2.4080 (6) |
| Cu_4d—Svii | 2.3344 (5) | | |
| | | |
| Si—Cu_2a—Sii | 107.01 (2) | Sv—Zn_4d—Svii | 108.781 (19) |
| Si—Cu_2a—Siii | 110.713 (19) | Svi—Zn_4d—Svii | 110.86 (2) |
| Si—Cu_2a—Siv | 110.713 (19) | Sviii—Sn_2b—Six | 109.658 (19) |
| Sii—Cu_2a—Siii | 110.713 (19) | Sviii—Sn_2b—Sx | 109.378 (18) |
| Sii—Cu_2a—Siv | 110.713 (19) | Sviii—Sn_2b—Svii | 109.378 (18) |
| Siii—Cu_2a—Siv | 107.01 (2) | Six—Sn_2b—Sx | 109.378 (18) |
| Zn_4d—Cu_4d—Si | 0 | Six—Sn_2b—Svii | 109.378 (18) |
| Zn_4d—Cu_4d—Sv | 0 | Sx—Sn_2b—Svii | 109.658 (19) |
| Zn_4d—Cu_4d—Svi | 0 | Cu_2axi—S—Cu_4dxi | 110.70 (2) |
| Zn_4d—Cu_4d—Svii | 0 | Cu_2axi—S—Cu_4dxii | 110.70 (2) |
| Si—Cu_4d—Sv | 110.86 (2) | Cu_2axi—S—Zn_4dxi | 110.70 (2) |
| Si—Cu_4d—Svi | 108.781 (19) | Cu_2axi—S—Zn_4dxii | 110.70 (2) |
| Si—Cu_4d—Svii | 108.781 (19) | Cu_2axi—S—Sn_2bxiii | 108.34 (2) |
| Sv—Cu_4d—Svi | 108.781 (19) | Cu_4dxi—S—Cu_4dxii | 110.81 (2) |
| Sv—Cu_4d—Svii | 108.781 (19) | Cu_4dxi—S—Zn_4dxi | 0.0 (5) |
| Svi—Cu_4d—Svii | 110.86 (2) | Cu_4dxi—S—Zn_4dxii | 110.81 (2) |
| Cu_4d—Zn_4d—Si | 0 | Cu_4dxi—S—Sn_2bxiii | 108.09 (2) |
| Cu_4d—Zn_4d—Sv | 0 | Cu_4dxii—S—Zn_4dxi | 110.81 (2) |
| Cu_4d—Zn_4d—Svi | 0 | Cu_4dxii—S—Zn_4dxii | 0.0 (5) |
| Cu_4d—Zn_4d—Svii | 0 | Cu_4dxii—S—Sn_2bxiii | 108.09 (2) |
| Si—Zn_4d—Sv | 110.86 (2) | Zn_4dxi—S—Zn_4dxii | 110.81 (2) |
| Si—Zn_4d—Svi | 108.781 (19) | Zn_4dxi—S—Sn_2bxiii | 108.09 (2) |
| Si—Zn_4d—Svii | 108.781 (19) | Zn_4dxii—S—Sn_2bxiii | 108.09 (2) |
| Sv—Zn_4d—Svi | 108.781 (19) | | |
| Symmetry codes: (i) x−1, y, z; (ii) −x+1, −y, z; (iii) y, −x+1, −z; (iv) −y, x−1, −z; (v) −x+1, −y+1, z; (vi) y−1/2, −x+3/2, −z+1/2; (vii) −y+1/2, x−1/2, −z+1/2; (viii) x−1/2, y−1/2, z+1/2; (ix) −x+1/2, −y+1/2, z+1/2; (x) y−1/2, −x+1/2, −z+1/2; (xi) x+1, y, z; (xii) −x+1/2, y−1/2, −z+1/2; (xiii) x+1/2, y+1/2, z−1/2. |
Experimental details
| Crystal data |
| Chemical formula | Cu2S4SnZn |
| Mr | 439.4 |
| Crystal system, space group | Tetragonal, I42m |
| Temperature (K) | 293 |
| a, c (Å) | 5.4353 (1), 10.8464 (3) |
| V (Å3) | 320.43 (1) |
| Z | 2 |
| Radiation type | ?, λ = 0.66842 Å |
| µ (mm−1) | 12.84 |
| Crystal size (mm) | 0.08 × 0.05 × 0.05 |
| |
| Data collection |
| Diffractometer | ? |
| Absorption correction | Empirical (using intensity measurements) |
| Tmin, Tmax | 0.91, 1.10 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 5275, 449, 449 |
| Rint | 0.088 |
| (sin θ/λ)max (Å−1) | 0.851 |
| |
| Refinement |
| R[F2 > 2σ(F2)], wR(F2), S | 0.029, 0.074, 1.60 |
| No. of reflections | 449 |
| No. of parameters | 15 |
| Δρmax, Δρmin (e Å−3) | 1.39, −2.17 |

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