Comments on `On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope' by Morawiec & Bouzy (2006)

The limitation of automatic indexing of electron diffraction patterns raised by Morawiec & Bouzy [(2006). J. Appl. Cryst. 39, 101-103 ] is discussed. The theoretical problem related to the famous 180° ambiguity may be surmounted by adequate technical improvements. Three solutions to avoid misindexing are briefly described.