A new method for determining the normals to planar structures and their trace directions in transmission electron microscopy

With aid of a transmission-electron-microscope (TEM) double-tilt holder, a method for determining the normals to planar structures and their traces in a TEM is developed. This method is considered to be simple and convenient when compared with other methods. The accuracy of the method for the determination of both the normals to planar structures and their traces is within 2°.