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Line shapes of the Kα1Kα2 doublet beam reflected from a parabolic graded multilayer (PGM) were analysed by ray tracing and rocking-curve measurements using an Si(400) flat single crystal. The integrated intensity and the intensity ratio of Kα2 to Kα1 of the reflected beam vary with the angle of incidence at the PGM. The rates of these variations are considered to increase with increasing spectral resolution of the PGM. The Kα1 and Kα2 beams are reflected from the PGM in slightly different directions. Therefore, the angular separation between the Kα1 and Kα2 peaks of the observed diffraction profile of a sample becomes smaller than that calculated from the two wavelengths for Kα1 and Kα2 when the PGM and the sample are arranged in the (+−) setting, and vice versa when they are in the (++) setting. The magnitude of the shift of the angular separation is close to the experimental uncertainty in the determination of the peak positions when the PGM consists of W/Si bilayers, whereas it is estimated to be three times as large when a PGM of high spectral resolution is used.

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