The Use of a Charge-Coupled-Device Imaging System for X-ray Film Intensity Measurement

The use of a simple charge-coupled-device-based imaging system for digitizing an X-ray film image is demonstrated. A method of extending the region of linear response of the film based upon an analytic representation of the observed response to a series of increasing exposures is described. The validity of the procedure is illustrated through an example of the absolute intensity measurement of a reflection of cadmium sulfide.