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A full-pattern fitting algorithm for energy-dispersive X-ray diffraction is proposed, especially for high-pressure X-ray diffraction studies. The algorithm takes into account the errors in measuring the energy and the diffraction angle. A lognormal function is introduced to represent the background. All the peaks that are detectable in the diffraction spectra, including fluorescence and diffraction peaks, are considered together. Because all the data points in the spectra are used, the accuracy of the cell parameters obtained by this method is very high. This is very helpful in the analysis of the equation of state and the identification of new phases under high pressure.

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Original version of paper, published October 2003

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