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Serial femtosecond crystallography (SFX) [Chapman et al. (2011), Nature, 470, 73-77], based on the X-ray free-electron laser, is a new and powerful tool for structure analysis at atomic resolution. This study proposes an extrapolation method for diffraction data analysis on the basis of diffraction intensity distribution in reciprocal space. Results show that this new method can restore SFX simulation data to structure factors that are more consistent with the structures used in simulation.

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