laboratory notes
A novel grazing-incidence in-plane X-ray diffraction setup based on a commercial four-circle diffractometer with a sealed-ceramic copper X-ray tube, upgraded with parabolic graded multilayer X-ray optics and a one-dimensional position-sensitive detector, is presented. The high potential of this setup is demonstrated by a phase analysis study of pentacene thin films and the determination of in-plane lattice constants of pentacene mono- and multilayers. The quality of the results compare well to studies performed at synchrotron radiation facilities.
Supporting information
Portable Document Format (PDF) file https://doi.org/10.1107/S0021889812000908/rg5007sup1.pdf |