Journal of Applied Crystallography
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J. Appl. Cryst.
(1999).
32
,
376-377
https://doi.org/10.1107/S0021889898011522
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Tcl/Tk-based programs. III.
CRITXPL
: graphical analysis of the
X-PLOR
refinement log files
L. M. Urzhumtseva
and
A. G. Urzhumtsev
CRITXPL
is a program for presenting graphically the variation of the criteria during an
X-PLOR
refinement.
Keywords:
X-PLOR
;
refinement
;
interactive graphics
;
Tcl/Tk
.
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