Cryogenic high-resolution X-ray spectrometers for SR-XRF and microanalysis

Frank, M.; Mears, C.A.; Labov, S.E.; Hiller, L.J.; Grand, J.B. le; Lindeman, M.A.; Netel, H.; Chow, D.; Barfknecht, A.T.

doi:10.1107/S0909049597014465

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
Fluorescence spectrum measured with a sample from a magnetic storage disk fabricated by IBM with 1000 eV incident X-rays. The composition and thickness of the various metal layers in this sample are indicated on the right-hand side of this figure. The energy resolution in the energy range shown was 10–15 eV.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 515-517

https://doi.org/10.1107/S0909049597014465

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