Characterization and interpretation of the quantum efficiencies of multilayer semiconductor detectors using a new theory

Cho, T.; Hirata, M.; Kohagura, J.; Sakamoto, Y.; Okamura, T.; Numakura, T.; Minami, R.; Nishizawa, Y.; Sasuga, T.; Tamano, T.; Yatsu, K.; Miyoshi, S.; Tanaka, S.; Sato, K.; Saitoh, Y.; Hirano, K.; Maezawa, H.

doi:10.1107/S0909049598000016

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 1
(a) Schematic drawing of a new multilayer semiconductor X-ray detector. X-ray injection directions A and B are shown. (b) A detailed cross section, viewed from the A direction, is shown with an absorbed X-ray beam (hatched).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 877-879

https://doi.org/10.1107/S0909049598000016

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