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Figure 3
Ga K X-ray spectrum of GaP wafer [2.5 GeV, 311 mA, Si(008) reflection, sample–crystal 280 mm, crystal–PSPC 710 mm].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 509-511
https://doi.org/10.1107/S0909049598001502
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